Materials Characterization Short Course: Surface Science Techniques – Focus on Photoelectron Spectroscopy and ToF-SIMS

Preliminary Agenda

Day1 – Photoelectron Spectroscopy:
09:00                Introduction and Scope of Short Course – Prof. F. Alamgir
09:15 – 10:00:  Lecture pt. I:  Theoretical background of Photoelectron Spectroscopy
10:05 – 10:30:  Tour of MCF characterization labs
10:35 – 10:45:  Coffee break
10:50 – 11:35:  Lecture pt. II:  Theoretical background of Photoelectron Spectroscopy
12:00 – 13:00:  Lunch break
13:05 – 13:45:  Introduction to XPS analysis software
13:45 – 15:05:  XPS hands-on operation and data analysis sessions. 
15:10 – 16:00:  General comments:  Open question and answer session

Day2 – Time of Flight SIMS:
09:30                Introduction– Prof. F. Alamgir
09:35 – 10:15:  Lecture pt. I:  Theoretical background of SIMS/ ToF-SIMS
10:15 – 10:30:  Tour of IEN microfabrication facility
10:35 – 10:45:  Coffee break
10:50 – 11:30:   Practical concerns for ToF-SIMS and Alternate Surface Science Techniques
11:30 – 13:00:   Lunch break
13:05 – 13:15:   Introduction to ToF-SIMS analysis software
13:15 – 15:15:   ToF-SIMS for hands-on analysis session.
15:20 – 15:55:   Open question and answer session
 

Registration will open July 6th, 2017

Questions? Please contact:
Prof. Faisal Alamgir, faisal.alamgir@mse.gatech.edu , or
Walter Henderson, walter.henderson@gatech.edu

Event Details

Date/Time:

  • Thursday, August 17, 2017
    9:00 am - 4:00 pm
Location: Marcus Nanotechnology Building | 345 Ferst Drive | Atlanta GA | 30332
Phone: (404) 894-5100
Email: info@ien.gatech.edu
Fee(s): Varies

For More Information Contact

Prof. Faisal Alamgir, faisal.alamgir@mse.gatech.edu , or
Walter Henderson, walter.henderson@gatech.edu